Aksoy, FundaKayah, RefikOeztas, MustafaBedir, MetinCetin, SAHikmet, I2019-08-012019-08-012007978-0-7354-0404-50094-243Xhttps://hdl.handle.net/11480/54536th International Conference of the Balkan-Physical-Union -- AUG 22-26, 2006 -- Istanbul, TURKEYStructural and optical properties of InP films developed with the solutions prepared with InCl3 and Cl2HPO4 salts having different rates by using spraying method have been investigated using the data obtained from UV spectrometer and XRD (x-ray difractometer). Band gap energy values of all samples obtained by using UV spectrometer are found in 1.60-1.85 eV range. It was observed that basic piks of all samples are in (200) plane and have a fee structure in the XRD analysis. In addition, grain size of the samples increases with the rate of indium included in samples and it is seen that the crystallization in surface structure tends to become more homogenity.eninfo:eu-repo/semantics/closedAccessInPspraying methodUV spectrometerXRDInvestigation of structural and optical properties of InP thin films developed by using spraying methodConference Object899231+2-s2.0-34547440907N/AWOS:000246647900094N/A