Yazar "Oeztas, Mustafa" seçeneğine göre listele

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    Investigation of structural and optical properties of InP thin films developed by using spraying method
    (AMER INST PHYSICS, 2007) Aksoy, Funda; Kayah, Refik; Oeztas, Mustafa; Bedir, Metin; Cetin, SA; Hikmet, I
    Structural and optical properties of InP films developed with the solutions prepared with InCl3 and Cl2HPO4 salts having different rates by using spraying method have been investigated using the data obtained from UV spectrometer and XRD (x-ray difractometer). Band gap energy values of all samples obtained by using UV spectrometer are found in 1.60-1.85 eV range. It was observed that basic piks of all samples are in (200) plane and have a fee structure in the XRD analysis. In addition, grain size of the samples increases with the rate of indium included in samples and it is seen that the crystallization in surface structure tends to become more homogenity.
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    Temperature and Thickness Effects on Electrical Properties of InP Films Deposited by Spray Pyrolysis
    (IOP PUBLISHING LTD, 2009) Kayali, Refik; Ari, Mehmet; Oeztas, Mustafa; Bedir, Metin; Aksoy, Funda
    InP film samples are prepared by spray pyrolysis technique using aqueous solutions of InCl(3) and Na(2)HPO(4), which are atomized with compressed air as carrier gas onto glass substrates at 500 degrees C with different thicknesses of the films. The structural properties of the samples are determined by x-ray diffraction (XRD). It is found that the crystal structure of the InP films is polycrystalline hexagonal. The orientations of all the obtained films are along the c-axis perpendicular to the substrate. The electrical measurements of the samples are obtained by dc four-probe technique on rectangular-shape samples. The effects of temperature on the electrical properties of the InP films are studied in detail.
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    The morphology and structural properties of InP thin films deposited by spray pyrolysis method
    (PERGAMON-ELSEVIER SCIENCE LTD, 2008) Aksoy, Funda; Kayali, Refik; Oeztas, Mustafa; Bedir, Metin
    InP film samples were prepared by spray pyrolysis technique using aqueous solutions of InCl3 and Na2HPO4, which were atomized with compressed air as carrier gas onto glass substrates at 500 degrees C with different thicknesses of the films. The structural properties of the samples have been determined by using X-ray diffraction (XRD). It was found that the crystal structure of the InP films is polycrystalline hexagonal. The orientations for all the obtained films are along the e-axis perpendicular to the substrate. It is observed that the crystallite sizes of the films increase with the thickness of the film up to 616 rim. The changes observed in the morphology and structural phases related to the film thickness have been discussed in detail. (C) 2007 Elsevier Ltd. All rights reserved.