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Öğe Analysis of line to line coupled coplanar waveguides with W-shaped conductor backing using conformal mapping method(JOHN WILEY & SONS INC, 2002) Tezekici, BS; Karpuz, C; Gorur, H; Gorur, AA W-shaped microshield coupled parallel coplanar waveguide (CP CPW), which is a new type of CP CPW, is proposed. Closed-form expressions are presented for calculating the quasistatic parameters of this coupled structure by using conformal mapping techniques. The effect of the W-shaped conductor backing on the coupling between CPWs is also discussed. Comparisons are made between the present numerical results and the results available in the microwave literature for CPW V-shaped microshield coupled lines (CWVMCLs) and CP CPWs with a flat conductor backing. In addition, the coupling coefficient of the coupled CPWs is shown to be significantly lower than that of the CWVMCLs in the literature. (C) 2002 Wiley Periodicals. Inc.Öğe Bandstop characteristics of microstrip slotted patch without periodic elements(JOHN WILEY & SONS INC, 2002) Gorur, A; Karpuz, C; Tezekici, BS; Gorur, HA rectangular microstrip slotted patch, which provides the bandgap with different manner of a PBG, is successfully demonstrated with the wideband tuning capability. Both experimental and simulated results confirm that the stopband characteristics can easily be controlled by the slot dimensions, especially by the slot length and the slot position. Moreover, the proposed structure is the simple and compact for MMIC applications. (C) 2002 Wiley Periodicals, Inc.Öğe Reduced-size dual-mode slotted patch resonator for low-loss and narrowband bandpass filter applications(INST ENGINEERING TECHNOLOGY-IET, 2004) Akgun, O; Tezekici, BS; Gorur, AA compact, low-loss and narrowband dual-mode microstrip filter is proposed using degenerate modes of a microstrip patch resonator loaded with two narrow slots. The resonator structure is fed by inset lines connected directly to the centre of adjacent edges of a microstrip patch with two notches. The dual-mode filter is verified by both simulation and measurement.