Structural and electronic properties of SnO2

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dc.authorid0000-0003-1629-2338
dc.authorid0000-0002-1418-2584
dc.authorid0000-0002-8973-6561
dc.authorid0000-0002-4411-5956
dc.contributor.authorAkgul, Funda Aksoy
dc.contributor.authorGumus, Cebrail
dc.contributor.authorEr, Ali O.
dc.contributor.authorFarha, Ashraf H.
dc.contributor.authorAkgul, Guvenc
dc.contributor.authorUfuktepe, Yuksel
dc.contributor.authorLiu, Zhi
dc.date.accessioned2019-08-01T13:38:39Z
dc.date.available2019-08-01T13:38:39Z
dc.date.issued2013
dc.departmentNiğde ÖHÜ
dc.description.abstractHighly transparent polycrystalline thin film of SnO2 (tin dioxide) was deposited using a simple and low cost spray pyrolysis method. The film was prepared from an aqueous solution of tin tetrachloride (stannic chloride) onto glass substrates at 400 degrees C. A range of diagnostic techniques including X-ray diffraction (XRD), UV-visible absorption, atomic force microscopy (AFM), scanning electron microscopy (SEM), and synchrotron-based X-ray photoelectron spectroscopy (XPS) were used to investigate structural, optical, and electronic properties of the resulting film. Deposited film was found to be polycrystalline. A mixture of SnO and SnO2 phases was observed. The average crystallite size of similar to 21.3 nm for SnO2 was calculated by Rietveld method using XRD data. The oxidation states of the SnO2 thin film were confirmed by the shape analysis of corresponding XPS O 1s, Sn 3d, and Sn 4d peaks using the decomposition procedure. The analysis of the XPS core level peaks showed that the chemical component is non-stoichiometric and the ratio of oxygen to tin (O/Sn) is 1.85 which is slightly under stoichiometry. (c) 2013 Elsevier B.V. All rights reserved.
dc.description.sponsorshipOffice of Science, Office of Basic Energy Sciences, of the US Department of Energy [DE-AC02-05CH11231]
dc.description.sponsorshipThe authors are grateful to the Advanced Light Source, Berkeley, California USA for providing synchrotron-based XPS facility. The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, of the US Department of Energy under Contract No. DE-AC02-05CH11231.
dc.identifier.doi10.1016/j.jallcom.2013.05.057
dc.identifier.endpage56
dc.identifier.issn0925-8388
dc.identifier.scopus2-s2.0-84878391079
dc.identifier.scopusqualityQ1
dc.identifier.startpage50
dc.identifier.urihttps://dx.doi.org/10.1016/j.jallcom.2013.05.057
dc.identifier.urihttps://hdl.handle.net/11480/4305
dc.identifier.volume579
dc.identifier.wosWOS:000324523500010
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthor[0-Belirlenecek]
dc.language.isoen
dc.publisherELSEVIER SCIENCE SA
dc.relation.ispartofJOURNAL OF ALLOYS AND COMPOUNDS
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectThin films
dc.subjectCrystal structure
dc.subjectElectronic properties
dc.subjectOptical properties
dc.subjectSynchrotron radiation
dc.subjectX-ray diffraction
dc.titleStructural and electronic properties of SnO2
dc.typeArticle

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