Investigation of thickness dependence on electronic structures of iron and nickel thin films by L-edge X-ray absorption spectroscopy

Basit Öğe Kaydı
dc.authorid0000-0002-4411-5956
dc.contributor.authorAkgul, Guvenc
dc.contributor.authorAkgul, Funda Aksoy
dc.contributor.authorUfuktepe, Yuksel
dc.date.accessioned2019-08-01T13:38:39Z
dc.date.available2019-08-01T13:38:39Z
dc.date.issued2014
dc.departmentNiğde ÖHÜ
dc.description.abstractWe have studied the effect of the film thickness on the electronic structure of pure nickel and iron thin films. Series of the thin films were evaporated by e-beam evaporation on SiN substrates. The electronic structure of the thin films was investigated using X-ray absorption near edge structure (XANES) spectroscopy. We have showed the thickness dependent variation of the experimental branching ratio (BR) and full-width at half-maximum (FWHM) at the L-3 and L-2 edges for both thin films. A strong thickness dependence of the L-2,L-3 BR and FWHM was found. We have also focused on the deviation of L-3 to L-2 ratio from its statistical value. The average L-3/L-2 white-line intensity ratio was calculated to be 3.4 and 3.0 from peak height and integrated area under each L-3 and L-2 peaks, respectively for iron. Additionally, a theoretical L-2,L-3 edge calculation for nickel was presented. The obtained results were consistent with the general view of the L-2,L-3 BR and FWHM of iron and nickel transition metals. (c) 2013 Elsevier Ltd. All rights reserved.
dc.description.sponsorshipDepartment of Energy (DOE), Office of Basic Energy Science; DOE Cooperative Research Program
dc.description.sponsorshipThe authors express their thank to Professor Piero Pianetta, Professor Herman Winick and the staff at the Stanford Synchrotron Radiation Lightsource (SSRL) for their excellent support, where the XANES experiments have been carried out. SSRL is supported by the Department of Energy (DOE), Office of Basic Energy Science. The authors acknowledge financial support the DOE Cooperative Research Program for the Synchrotron-light for Experimental Science and Applications in the Middle East (SESAME).
dc.identifier.doi10.1016/j.vacuum.2013.06.003
dc.identifier.endpage215
dc.identifier.issn0042-207X
dc.identifier.scopus2-s2.0-84880057816
dc.identifier.scopusqualityQ1
dc.identifier.startpage211
dc.identifier.urihttps://dx.doi.org/10.1016/j.vacuum.2013.06.003
dc.identifier.urihttps://hdl.handle.net/11480/4301
dc.identifier.volume99
dc.identifier.wosWOS:000325384400037
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthor[0-Belirlenecek]
dc.language.isoen
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.relation.ispartofVACUUM
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectMetals
dc.subjectThin films
dc.subjectXANES
dc.subjectElectronic structure
dc.titleInvestigation of thickness dependence on electronic structures of iron and nickel thin films by L-edge X-ray absorption spectroscopy
dc.typeArticle

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