Observation of Substrate Orientation-Dependent Oxygen Defect Filling in Thin WO3-delta/TiO2 Pulsed Laser-Deposited Films with in Situ XPS at High Oxygen Pressure and Temperature

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dc.authorid0000-0002-8973-6561
dc.authorid0000-0002-6992-7774
dc.authorid0000-0003-3287-8304
dc.contributor.authorBraun, Artur
dc.contributor.authorAkgul, Funda Aksoy
dc.contributor.authorChen, Qianli
dc.contributor.authorErat, Selma
dc.contributor.authorHuang, Tzu-Wen
dc.contributor.authorJabeen, Naila
dc.contributor.authorZhang, Xiaojun
dc.date.accessioned2019-08-01T13:38:39Z
dc.date.available2019-08-01T13:38:39Z
dc.date.issued2012
dc.departmentNiğde ÖHÜ
dc.description.abstractSubstoichiometric tungsten oxide films of approximately 10 nm thickness deposited with pulsed laser ablation on single-crystal TiO2 substrates with (001) and (110) orientation show defect states near the Fermi energy in the valence-band X-ray photoelectron spectroscopy (XPS) spectra. The spectral weight of the defect states is particularly strong for the film grown on the (001) surface. In situ XPS under an oxygen pressure of 100 mTorr shows that the spectral weight of the defect states decreases significantly at 500 K for the film on the (110) substrate, whereas that of the film grown on the (001) substrate remains the same at a temperature up to 673 K. Furthermore, diffusion of titanium from the substrate to the film surface is observed on the (110) substrate, as is evidenced by the sudden appearance of the Ti 2p core level signature above 623 K and below 673 K. The film grown on the (001) surface does not show such an interdiffusion effect, which suggests that the orientation of the substrate can have a significant influence on the high-temperature integrity of the tungsten oxide films. Quantitative analysis of the O Is core level XPS spectra shows that chemisorbed water from sample storage under ambient conditions is desorbed during heating under oxygen exposure.
dc.description.sponsorshipEuropean Community [042095, 227179]; Swiss NSF [200021-116688, 200021-132126, IZK0Z2-133944, 20021-124812]; Swiss Federal Office of Energy [152316-101883, 153613-102809, 153476-102691]; Office of Science/BES, of the U.S. Department of Energy [DE-AC02-05CH11231]
dc.description.sponsorshipThe research leading to these results received funding from the European Community's Sixth Framework Marie Curie International Reintegration Program (Grant 042095; HiTempEchem, X-ray and Electrochemical Studies on Solid Oxide Fuel Cells and Related Materials), Seventh Framework Program Novel Materials for Energy Applications (Grant 227179; NanoPEC, Nanostructured Photoelectrodes for Energy Conversion), Swiss NSF Grants 200021-116688 (to SE.), 200021-132126 and IZK0Z2-133944 (to A.B.), and 20021-124812 (to QC.), and Swiss Federal Office of Energy Contracts 152316-101883, 153613-102809, and 153476-102691. The ALS is supported by the Director, Office of Science/BES, of the U.S. Department of Energy (Contract DE-AC02-05CH11231).
dc.identifier.doi10.1021/cm301829y
dc.identifier.endpage3480
dc.identifier.issn0897-4756
dc.identifier.issue17
dc.identifier.scopus2-s2.0-84866110335
dc.identifier.scopusqualityQ1
dc.identifier.startpage3473
dc.identifier.urihttps://dx.doi.org/10.1021/cm301829y
dc.identifier.urihttps://hdl.handle.net/11480/4543
dc.identifier.volume24
dc.identifier.wosWOS:000308833400021
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthor[0-Belirlenecek]
dc.language.isoen
dc.publisherAMER CHEMICAL SOC
dc.relation.ispartofCHEMISTRY OF MATERIALS
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjecttungsten oxide
dc.subjectoxygen defect
dc.subjectoxygen vacancy
dc.subjectvalence band
dc.subjectphotoemission spectroscopy
dc.subjectXPS
dc.subjectdefect filling
dc.subjectambient-pressure XPS
dc.subjectphotoanode
dc.subjectsolar water splitting
dc.subjectthin film
dc.subjectWO3
dc.subjectTiO2
dc.subjectphotoelectrochemistry
dc.subjectinterdiffusion
dc.subjectdiffusion barrier
dc.titleObservation of Substrate Orientation-Dependent Oxygen Defect Filling in Thin WO3-delta/TiO2 Pulsed Laser-Deposited Films with in Situ XPS at High Oxygen Pressure and Temperature
dc.typeArticle

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