Self-anti-reflective density-modulated thin films by HIPS technique

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dc.authoridKeles, Filiz/0000-0003-4548-489X
dc.contributor.authorKeles, Filiz
dc.contributor.authorBadradeen, Emad
dc.contributor.authorKarabacak, Tansel
dc.date.accessioned2024-11-07T13:34:12Z
dc.date.available2024-11-07T13:34:12Z
dc.date.issued2017
dc.departmentNiğde Ömer Halisdemir Üniversitesi
dc.description.abstractA critical factor for an efficient light harvesting device is reduced reflectance in order to achieve high optical absorptance. In this regard, refractive index engineering becomes important to minimize reflectance. In this study, a new fabrication approach to obtain density-modulated CuInxGa((1-x)) Se-2 (CIGS) thin films with self-anti-reflective properties has been demonstrated. Density-modulated CIGS samples were fabricated by utilizing high pressure sputtering (HIPS) at Ar gas pressure of 2.75. x 10(-2) mbar along with conventional low pressure sputtering (LPS) at Ar gas pressure of 3.0. x 10(-3) mbar. LPS produces conventional high density thin films while HIPS produces low density thin films with approximate porosities of similar to 15% due to a shadowing effect originating from the wide-spread angular atomic of HIPS. Higher pressure conditions lower the film density, which also leads to lower refractive index values. Density-modulated films that incorporate a HIPS layer at the side from which light enters demonstrate lower reflectance thus higher absorptance compared to conventional LPS films, although there is not any significant morphological difference between them. This result can be attributed to the self-anti-reflective property of the density-modulated samples, which was confirmed by the reduced refractive index calculated for HIPS layer via an envelope method. Therefore, HIPS, a simple and scalable approach, can provide enhanced optical absorptance in thin film materials and eliminate the need for conventional light trapping methods such as anti-reflective coatings of different materials or surface texturing.
dc.description.sponsorshipNASA [NNX09AW22A]; NSF [EPS-1003970, 1159830]; Directorate For Engineering; Div Of Chem, Bioeng, Env, & Transp Sys [1159830] Funding Source: National Science Foundation; NASA [NNX09AW22A, 104717] Funding Source: Federal RePORTER
dc.description.sponsorshipThis work was supported by NASA (grant no. NNX09AW22A) and the NSF (grant no. EPS-1003970 and 1159830). The authors thank UA Little Rock Center for Integrative Nanotechnology Sciences for helping with SEM imaging and EDS profile mapping. The authors also thank Mr Matthew Brozak for proofreading the manuscript.
dc.identifier.doi10.1088/1361-6528/aa7b3b
dc.identifier.issn0957-4484
dc.identifier.issn1361-6528
dc.identifier.issue33
dc.identifier.pmid28643701
dc.identifier.scopus2-s2.0-85026345219
dc.identifier.scopusqualityQ1
dc.identifier.urihttps://doi.org/10.1088/1361-6528/aa7b3b
dc.identifier.urihttps://hdl.handle.net/11480/15855
dc.identifier.volume28
dc.identifier.wosWOS:000406131000002
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.indekslendigikaynakPubMed
dc.language.isoen
dc.publisherIop Publishing Ltd
dc.relation.ispartofNanotechnology
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_20241106
dc.subjectcopper indium gallium diselenide (CIGS)
dc.subjectsputter pressure
dc.subjectrefractive index
dc.subjectthin film
dc.subjectmaterial density
dc.subjectoptical property
dc.titleSelf-anti-reflective density-modulated thin films by HIPS technique
dc.typeArticle

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