Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films
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Date
2011
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
WILEY-BLACKWELL
Access Rights
info:eu-repo/semantics/closedAccess
Abstract
We report on the near-edge X-ray absorption fine structure spectroscopy of the L(3) (2p(3/2)) and L(2) (2p(1/2)) edges for ferromagnetic pure nickel transition metal and show that the L(2,3) edge peak intensity and satellite feature at similar to 6 eV above the L(3) edge in nickel increase with increasing nickel film thickness both in the total electron yield and transmission modes. The absorption spectra of nickel metal, however, exhibit strong angular-dependent effects when measured in total electron yield mode. In addition, we calculated the mean electron escape depth of the emitted electrons (lambda(e)), which was found for pure nickel metal to be lambda(e) = 25 +/- 2 angstrom. We point out the advantages of the total electron yield technique for the study of the L-edge of 3d transition metals. Copyright (C) 2011 John Wiley & Sons, Ltd.
Description
Keywords
NEXAFS, nickel, transmission yield, 3d transition metals, electron escape depth
Journal or Series
X-RAY SPECTROMETRY
WoS Q Value
Q3
Scopus Q Value
Q4
Volume
40
Issue
6
