Thickness and angular dependence of the L-edge X-ray absorption of nickel thin films

Basit Öğe Kaydı
dc.authorid0000-0002-4411-5956
dc.authorid0000-0001-9524-6908
dc.contributor.authorUfuktepe, Y.
dc.contributor.authorAkgul, G.
dc.contributor.authorAksoy, F.
dc.contributor.authorNordlund, D.
dc.date.accessioned2019-08-01T13:38:39Z
dc.date.available2019-08-01T13:38:39Z
dc.date.issued2011
dc.departmentNiğde ÖHÜ
dc.description.abstractWe report on the near-edge X-ray absorption fine structure spectroscopy of the L(3) (2p(3/2)) and L(2) (2p(1/2)) edges for ferromagnetic pure nickel transition metal and show that the L(2,3) edge peak intensity and satellite feature at similar to 6 eV above the L(3) edge in nickel increase with increasing nickel film thickness both in the total electron yield and transmission modes. The absorption spectra of nickel metal, however, exhibit strong angular-dependent effects when measured in total electron yield mode. In addition, we calculated the mean electron escape depth of the emitted electrons (lambda(e)), which was found for pure nickel metal to be lambda(e) = 25 +/- 2 angstrom. We point out the advantages of the total electron yield technique for the study of the L-edge of 3d transition metals. Copyright (C) 2011 John Wiley & Sons, Ltd.
dc.description.sponsorshipStanford Synchrotron Radiation Lightsource (SSRL); Department of Energy (DOE), Office of Basic Energy Science; University of Cukurova; DOE
dc.description.sponsorshipThe authors express their thanks to Prof. Piero Pianetta, Prof. Herman Winick, and the staff at the Stanford Synchrotron Radiation Lightsource (SSRL) for their excellent support, where the NEXAFS experiments have been carried out. SSRL is supported by the Department of Energy (DOE), Office of Basic Energy Science. Y.U. acknowledges financial support from the University of Cukurova and the DOE Cooperative Research Program for the Synchrotron-light for Experimental Science and Applications in the Middle East (SESAME).
dc.identifier.doi10.1002/xrs.1362
dc.identifier.endpage431
dc.identifier.issn0049-8246
dc.identifier.issue6
dc.identifier.scopus2-s2.0-80055114756
dc.identifier.scopusqualityQ4
dc.identifier.startpage427
dc.identifier.urihttps://dx.doi.org/10.1002/xrs.1362
dc.identifier.urihttps://hdl.handle.net/11480/4677
dc.identifier.volume40
dc.identifier.wosWOS:000297053400006
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthor[0-Belirlenecek]
dc.language.isoen
dc.publisherWILEY-BLACKWELL
dc.relation.ispartofX-RAY SPECTROMETRY
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectNEXAFS
dc.subjectnickel
dc.subjecttransmission yield
dc.subject3d transition metals
dc.subjectelectron escape depth
dc.titleThickness and angular dependence of the L-edge X-ray absorption of nickel thin films
dc.typeArticle

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