Temperature-dependence of electrical resistivity of Cd-Sn, Bi-Sn, and Al-Si eutectic and Al-3wt.%Si hypoeutectic alloys
Küçük Resim Yok
Tarih
2006
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
SPRINGER
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
Cd-Sn, Bi-Cd, and Al-Si eutectic and Al-3wt.%Si hypoeutectic alloys of high-purity (99.99%) metals were produced in a vacuum atmosphere. Current-voltage (I-V) characteristics of these specimens were measured at various temperatures between 100 and 475 K. The electrical resistivity (p) and temperature coefficient (alpha) for each specimen, depending on the temperature, were calculated using results obtained from the I-V measurements. The electrical resistivities and the residual resistivity of the specimens increase with increasing temperature for each alloy system. These results are compared with literature results.
Açıklama
Anahtar Kelimeler
crystal growth, electrical properties, metals and alloys
Kaynak
JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE
WoS Q Değeri
Q4
Scopus Q Değeri
Q2
Cilt
15
Sayı
4
