Temperature-dependence of electrical resistivity of Cd-Sn, Bi-Sn, and Al-Si eutectic and Al-3wt.%Si hypoeutectic alloys

dc.contributor.authorCadirli, E.
dc.contributor.authorKaya, H.
dc.contributor.authorGuemues, A.
dc.contributor.authorYilmazer, I.
dc.date.accessioned2019-08-01T13:38:39Z
dc.date.available2019-08-01T13:38:39Z
dc.date.issued2006
dc.departmentNiğde ÖHÜ
dc.description.abstractCd-Sn, Bi-Cd, and Al-Si eutectic and Al-3wt.%Si hypoeutectic alloys of high-purity (99.99%) metals were produced in a vacuum atmosphere. Current-voltage (I-V) characteristics of these specimens were measured at various temperatures between 100 and 475 K. The electrical resistivity (p) and temperature coefficient (alpha) for each specimen, depending on the temperature, were calculated using results obtained from the I-V measurements. The electrical resistivities and the residual resistivity of the specimens increase with increasing temperature for each alloy system. These results are compared with literature results.
dc.identifier.doi10.1361/105994906X124578
dc.identifier.endpage493
dc.identifier.issn1059-9495
dc.identifier.issn1544-1024
dc.identifier.issue4
dc.identifier.scopus2-s2.0-33748064665
dc.identifier.scopusqualityQ2
dc.identifier.startpage490
dc.identifier.urihttps://dx.doi.org/10.1361/105994906X124578
dc.identifier.urihttps://hdl.handle.net/11480/5497
dc.identifier.volume15
dc.identifier.wosWOS:000239637700020
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthor[0-Belirlenecek]
dc.language.isoen
dc.publisherSPRINGER
dc.relation.ispartofJOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectcrystal growth
dc.subjectelectrical properties
dc.subjectmetals and alloys
dc.titleTemperature-dependence of electrical resistivity of Cd-Sn, Bi-Sn, and Al-Si eutectic and Al-3wt.%Si hypoeutectic alloys
dc.typeArticle

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