INFLUENCE OF SULFURIZATION ON THE PROPERTIES OF Cu2ZnSnS4 (CZTS) THIN FILMS PREPARED BY A TWO-STAGE PROCESS
Küçük Resim Yok
Tarih
2019
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Erişim Hakkı
info:eu-repo/semantics/openAccess
Özet
In this study, CZTS thin films were grown by a two-stage method involved sputter deposition of metallic Cu,Zn, and Sn layers to form Cu/Sn/Zn/Cu metallic stacks on glass and sulfurization of the metallic stacks at 540and 580 °C for 1 and 5 min in sulfur vapor atmosphere. The reacted samples at two different sulfurizationtemperatures and sulfurization times were characterized employing XRD, SEM, EDX, Raman spectroscopy,optical spectroscopy, and Van der Pauw methods. The metallic stacks and CZTS thin films showed Cu-rich andZn-poor composition. XRD patterns of the reacted films showed almost pure kesterite CZTS phase except forpresence of very small amount of Cu2-xS phase. Raman spectra of the films verified formation of kesterite phasein the films. SEM images showed that the CZTS540-1 sample had more compact, denser and uniform structure.Optical band gap values were found to be in good agreement with the literature. The CZTS540-1 thin filmshowed the highest carrier concentration and lowest resistivity values amongst the other samples.
Açıklama
Anahtar Kelimeler
Nanobilim ve Nanoteknoloji, Malzeme Bilimleri, Özellik ve Test, Malzeme Bilimleri, Kaplamalar ve Filmler, Fizikokimya, Mühendislik, Kimya, Kimya, İnorganik ve Nükleer
Kaynak
Niğde Ömer Halisdemir Üniversitesi Mühendislik Bilimleri Dergisi
WoS Q Değeri
Scopus Q Değeri
Cilt
8
Sayı
2
